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Home > english-chinese > "芯片测试" in Chinese

Chinese translation for "芯片测试"

chip testing

Related Translations:
磊芯片:  led epi wafer
晶体管芯片:  transistor chip
芯片处理:  chiprocessingdie processingwafer processing
芯片编号:  chip number
芯片数量:  chicountcount, chip
芯片粘贴:  die bonding
测试芯片:  test chiptest die
微芯片:  microchip
芯片操作系统:  cos chioperation system
性格芯片:  personality chips
Example Sentences:
1.Bluetooth headset main chip testing f
蓝牙耳机主芯片测试
2.Test results show an excellent performance of the chip
芯片测试结果显示芯片性能优异,达到预期的设计要求。
3.Study on test control for system - on - a - chip based on test data slicing
基于数据切片的系统芯片测试控制技术研究
4.To debug on the hardware , eliminate circuitry errors , and test on every chip . 3
对板卡硬件调试,线路排错,芯片测试; 3
5.Because the truly characteristic of random numbers ca n ' t be proved by testing the chip , it ' s very important to guarantee it in the theory
由于随机数的真随机性不可能在芯片测试时得到证明,因此在理论上保证它的真随机性显得尤为的重要。
6.Test results show that this adc achieves the snr of 90 db and distortion ratio of 0 . 0248 % for a 20khz signal bandwidth while operating under a single 3 . 3v supply
芯片测试结果显示其信噪比达到90db ,总谐波失真0 . 0248 % ,基本达到了预期的设计指标。
7.The testing of the chip is faced with very serious challenge , the cost of testing is always rising , and even larger than the designing and manufacturing cost
芯片测试遇到了前所未有的挑战,测试费用越来越高,出现了设计、生产费用与测试费用倒挂的局面。
8.Based on that , the author simulated most of the sub - block circuits and whole chip circuit by applying eda tools hspice . the simulation results indicate that the ic has achieved the expectation ,
理论分析、仿真结果和芯片测试数据表明,在典型情况下,该电路的电流控制精度相对误差和匹配相对误差可以控制在0 . 5 %以内,达到了预定设计目标。
9.With the sharp development of lsi and vlsi , the integration of chip gets denser and denser . but the extra ports for testing is limited and test is more difficult than before . we even must spend more time and money on chip testing rather than chip design
大规模集成和超大规模集成电路迅速发展,使芯片的集成度越来越高,而供外部测试的引脚却很少,测试问题日趋困难,甚至使芯片测试比芯片本身的设计和生产要付出更高的代价。
10.We aslo get the theory of verification test and design debug discussed , and then , some work on the verification test of this integrated circuits have been done . for the sake of finding out the reason of noise occurring in circuit of oscillator , we probe into causation of technics and mechanism
论文最后基于芯片测试理论,针对芯片流片后的部分测试结果,对振荡出现的噪声问题给出了初步分析,并结合投片工艺探讨了工艺原因与产生机理。
Similar Words:
"芯片布局" Chinese translation, "芯片布置布线图" Chinese translation, "芯片布置网" Chinese translation, "芯片材料" Chinese translation, "芯片操作系统" Chinese translation, "芯片插座" Chinese translation, "芯片成品率" Chinese translation, "芯片承载器" Chinese translation, "芯片尺寸" Chinese translation, "芯片尺寸封装" Chinese translation