| 1. | Determination of impurities in imidacloprid by hplc - msd 法鉴定吡虫啉中的微量杂质 |
| 2. | Trace impurities analysis of hydrocortisonum by lc - apci - ms 大气压化学电离飞行时间质谱分析氢化可的松中微量杂质 |
| 3. | Icp - aes determination of micro - amounts of 15 elements present as impurities in uranium - molybdenum alloy 钼合金中15种微量杂质元素 |
| 4. | Measurement of the trace impurity in the high pure gas by refitted sp - 2305 gas chromatography 2305型气相色谱仪测定气体中的微量杂质 |
| 5. | Unless otherwise specified , this method is not used for inspection of trace impurities 除另有规定外,一般不宜用于微量杂质的检查。 |
| 6. | Standard test method for trace impurities in monocyclic aromatic hydrocarbons by gas chromatography 气相色谱法测定单环芳烃中微量杂质的标准试验方法 |
| 7. | Standard test method for trace impurities in monocyclic aromatic hydrocarbons by gas chromatography and external calibration 用气相色谱法和外部校准法对单环芳香烃中微量杂质的标准试验方法 |
| 8. | In the paper the structure and principle of the secondary ion mass spectrometry ( sims ) are reported , and its typical applications in the hgcdte material and devices processing , especially in the measurement of the junction depth and the quantity analysis of trace impurity are introduced 摘要文章介绍了二次离子质谱仪的结构及其基本工作原理,并通过对典型应用的分析,介绍了二次离子质谱分析技术在高灵敏度碲镉汞红外焦平面探测器材料和器件制备工艺中的作用,特别是在结探监测和微量杂质监控方面所发挥的重要作用。 |