An analysis of the design theory of micro - electronics device preventing the error action by lightning induction 微电子装置防雷电感应误动作设计原理分析
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This destructive charge buildup can occur when high - energy particles penetrate spacecraft walls or protective shielding and then bury themselves in the dielectric semiconductor materials in microelectronics or solar cells 高能量粒子穿透太空船外壁或保护层，停留在微电子装置或太阳能电池的介电质半导体材料中时，往往会发生毁灭性的电荷积聚现象。
