| 1. | A measurement method of microwave surface resistance of large area high tc super - conductive thin films
高温超导薄膜微波表面电阻测试方法 |
| 2. | Bounded convergence of forgetting factor least square algorithm for time - varying systems
本系统是按照目前国际上高温超导薄膜的微波表面电阻的测量标准方案 |
| 3. | Though both of the methods have it ’ s own advantage and disadvantage , the rs can be measured with high sensitivity
这两种方法虽然各有优缺点,但都能够测量高温超导薄膜的微波表面电阻,而且测试灵敏度较高。 |
| 4. | Two kinds of microwave surface resistance rs measurements of high tc superconductive thin films are introduced in this paper , two - resonator method and the sapphire resonator method
本文介绍了两种测试高温超导薄膜微波表面电阻的方法:双谐振器法和蓝宝石介质谐振器法。 |
| 5. | Two - resonator method is using to build the draft of international measurement standard of rs for high tc superconductive thin films , in which the rs value of the hts films can be determined by unloaded q ’ s measured from two resonators by using simple formulas
目前,国际上用双谐振器法建立高温超导薄膜微波表面电阻rs国际测试标准草案。此法是基于模式匹配方法,通过严格的推理得到简单的方程,从谐振器的谐振频率和固有品质因数可以求出超导薄膜的rs 。 |
| 6. | As the manufacture technology of high temperature superconductor ( hts ) film is improved continually , it is applied more and more widely . then it is becoming urgent to measure the microwave surface resistance of hts film that is one of the most important parameters of hts film
高温超导薄膜制备技术的不断提高使得薄膜的应用日益广泛,因而对薄膜各种性能指标的测定也显得更加重要,这就迫切需要对超导薄膜最主要特性之一微波表面电阻进行精确的测试。 |
| 7. | As the manufacture technology of high temperature superconductor ( htsc ) film is greatly improved , it is applied more and more widely . then it is becoming urgent to precisely measure the surface resistance of htsc film that is one of the most important parameters of htsc film
高温超导薄膜制备技术的不断提高使得薄膜的应用日益广泛，因而对薄膜各种性能指标的测定也显得更加重要，这就迫切需要对超导薄膜最主要的微波特性参数微波表面电阻进行精确的测试。 |
| 8. | The sapphire resonator method studied in this paper is used to apply for the national measurement standard of rs for high tc superconductive thin films , in which the rs value of hts film can be determined by measuring the change of the unloaded quality factors of the loaded resonator
在国内,本论文研制的蓝宝石介质谐振器法正在申请高温超导微波表面电阻rs国家测试标准。此法通过测量加载超导薄膜后介质谐振腔的固有品质因数的变化来确定超导薄膜的微波表面电阻。 |
| 9. | Sapphire resonator working in te011 + mode is used in this paper to nondestructively measure the microwave surface resistance rs of a single piece of hts thin film at 77k . the microwave surface of htsc film under test can be determined by measuring the change of the unloaded quality factors of the loaded resonator
本文就对超导薄膜的微波表面电阻的测试进行了系统的研究。本文介绍了一种利用te011 +模式的蓝宝石介质谐振器测量高温超导薄膜微波表面电阻的方法，通过测量加载超导薄膜前后介质谐振腔的固有品质因数的变化来确定超导薄膜的微波表面电阻。 |
| 10. | Srtio _ 3 ( sto ) thin films exhibit a large electric field dependence of dielectric permittivity . the microwave surface resistance of yba2cu3o7 - x ( ybco ) is much lower than that of the normal conductor . the typical value of rs for ybco epitaxial thin film is smaller than 1 m
在低温下, srtio _ 3 (简写为sto )薄膜具有强烈的非线性介电性质,即:介电常数随外加直流电场变化而变化; yba2cu3o7 - x (简写为ybco )具有极低的微波表面电阻, rs ( 10ghz , 77k ) < 1m ,而且它们的晶体结构相似,晶格常数匹配以及化学性质相容。 |
