| 1. | Potential is defined relative to an arbitrary datum .
势是相对于任意参考面而定义的。 |
| 2. | Test method for measuring flat length on slices of electronic materials
电子材料晶片参考面长度测量方法 |
| 3. | Analysis of signal integrity of high - speed interconnects on meshed ground plane
网孔状地参考面上高速互连的信号完整性分析 |
| 4. | The complex amplitude of cylindrical wave fields in the reference plan vertical to the optical axis
柱面光波场在垂直光轴方向的参考面上的复振幅表示 |
| 5. | Surface texture - variations found on the real surface of the wafer that deviate from the reference surface
表面纹理-晶圆片实际面与参考面的差异情况。 |
| 6. | Optics and optical instruments - microscopes - imaging distances related to mechanical reference planes - part 1 : tube length 160 mm iso 9345 - 1 : 1996
光学和光学仪器.显微镜.相对机械参考面的象距.第1部 |
| 7. | Optics and optical instruments - microscopes - imaging distances related to mechanical reference planes - infinity - corrected optical systems
光学和光学仪器.显微镜.相对机械参考面的象距.无限大光学校正系统 |
| 8. | Optics and optical instruments - microscopes - imaging distances related to mechanical reference planes - part 2 : infinity - corrected optical systems iso 9345 - 2 : 2003
光学和光学仪器.显微镜.相对机械参考面的象距.第2部 |
| 9. | In order to improve the success rate of scattering point search , the neighbors of the reference elements in reference paths were considered while the scattering points were not found on the reference elements , and the single reference path was also doubled to increase the efficiency of ray tracing
摘要针对面元形式的目标数据，从提高入射点求解的成功率着手，采用增加对参考路径上参考面元的相邻单元进行相交性判断的方法，并将普通径迹法的单参考路径改为双参考路径，提高了径迹法射线追踪的效率。 |
| 10. | Indirect ray method contains the following steps : the receiving plane wave field intensities on an adapted closed surface encloseing the antenna is calculated and then the radiation field of the antenna on the same closed surface is obtained from the given antenna . after using lorentz reciprocal theorem , the far field patterns with and without radome are gotten
间接射线法的分析步骤为:从参考面出发的入射平面波(经天线罩)在闭合面sa (在天线罩内且包围天线)上的接收场为et 、 ht ,天线在sa上的发射场为ea 、 ha ,由洛仑兹互易定理可求出天线的远区场。 |
