| 1. | Standard test procedures for semiconductor x - ray energy spectrometers
半导体x射线能谱仪的标准试验程序 |
| 2. | Surface composition analysis method of gold - plated products by edx
黄金制品镀层成分的x射线能谱测量方法 |
| 3. | Nondestructive method of x - ray eds analysis with sem for gold jewelry
黄金饰品的扫描电镜x射线能谱分析方法 |
| 4. | General specification of x - ray eds quantitative analysis for epma and sem
电子探针和扫描电镜x射线能谱定量分析通则 |
| 5. | However , the beam spectrum of a ct system is not constant normally
然而，一般而言ct系统的x射线能谱并不是恒定不变的。 |
| 6. | Standard test procedures for semiconductor x - ray energy spectrometers ; amendment 1
半导体x射线能谱仪的标准试验程序.第1次修改 |
| 7. | Identification method of authigenic clay mineral in sedimentary rock by sem xeds
沉积岩中自生粘土矿物扫描电子显微镜及x射线能谱鉴定方法 |
| 8. | General specification of thin biological standards for x - ray - ray eds microanalysis in electron microscope
电子显微镜x射线能谱分析生物薄标样通用技术条件 |
| 9. | Paper and board . qualitative analysis of mineral filler and mineral coating . sem edax method
纸和纸板中无机填料和无机涂料的定性分析电子显微镜x射线能谱法 |
| 10. | Measurement procedures for semiconductor x - ray detector system and semiconductor x - ray energy spectrometers
半导体x射线探测器系统和半导体x射线能谱仪的测量方法 |
