Computer programs were writte11 using theory above to calculating the arbitrary structure multi - layer conductor x - ray diftyaction . the experiment data is simulated using dynamical and kinematical theory respectively to get the structure parameters of the sample 利用上面的理论,编写了可以计算任意多层结构半导体的x射线衍射程序,分别用动力学和运动学衍射理论模型进行实验数据的数值模拟,得到超晶格样品的结构参数。