| 1. | The presence of stray light is indicated by the absence of complete extinction when the phase difference is such that this should be achieved .
若位差达到应当消光的程度，却未能完全消光即表示有杂散光存在。 |
| 2. | Veiling glare of optical systems - methods of measurement
光学系统杂散光测量方法 |
| 3. | Measuring the stray light in monochromator
单色仪杂散光的一种测量方法 |
| 4. | Stray light inside multi - pass laser cavity of the sg - iii prototype module
多通放大器腔内杂散光 |
| 5. | Who should attend : optical engineers who wish to learn more about modeling illumination systems and performing stray light analysis with zemax
针对人士：想要学习利用zemax进行更多的照明系统建模和杂散光分析的光学工程师。 |
| 6. | There are tradeoffs between these gratings : holographic gratings produce less stray light while ruled gratings are more reflective , resulting in higher sensitivity
这些光栅之间有交替：当常规光栅有更多反射时，全息光栅提供少量杂散光，从而产生更高的灵敏度。 |
| 7. | The article mainly includes the design of experimental set and concentration retrieve arithmetic . as doas technique is a kind of weak light detecting technology , it is the key to increase the snr ( signal - to - noise ) of spectral signal
由于差分吸收光谱技术是一种弱光检测技术，所以对于其相关实验装置来讲，提供高的信噪比是关键，从而使得限制杂散光、消除各种光电子噪声等变得很重要。 |
| 8. | The course covers non - sequential ray tracing , sources , detectors , objects , ray splitting , scattering , ghost analysis , stray light analysis , prisms , fresnel lenses , multi - element lenses , gradient index , polarization and thin film modeling
本课程涵盖了非连续光线的追迹、光源、探测器、物体、分光、散射、鬼像分析、杂散光分析、棱镜、菲涅耳透镜、多元件透镜、梯度折射率、偏振和薄膜的建立。 |
| 9. | With the sample of the beam in high power multi - pass amplification , the three - dimensional mathematic model had been set up and the calculation method which functions well in solving these mathematic model is got , the computer simulation of the optical path is also realized
通过对多程放大系统的高斯光束进行高密度典型光线取样，建立杂散光及鬼像分析的三维数学模型，进而得出适合于求解这类数学模型的计算方法，实现计算机光路模拟。 |
| 10. | The analytical software can comprehensively detect these ghost images generated by ghost reflections and simulate the energy attenuation process of ghost beam . the position of ghost image can be picked out , the potential hazard of ghost images to key elements can be verified , and the irradiance at ghost image and key elements can be described
编制的专门的杂散光分析软件能全面捕捉系统中激光束多次残余反射产生的鬼像，并模拟鬼光束的能量衰减过程，从而找出对光学元件及系统性能存在威胁的鬼像，确定其位置，同时对各光学元件特别是关键元件处的能量密度与元件的稳定性进行描述。 |
