| 1. | Resistivity measuring instruments with four - probe array method
四探针电阻率测试仪 |
| 2. | Generic specification of four - point probe
四探针探头通用技术条件 |
| 3. | The four - probe method to measure the conductivity of metal thin board
金属薄板电导率的四探针测量法 |
| 4. | Four - point probe - test equipment used to test resistivity of wafers
四探针-测量半导体晶的阻电面表片设备。 |
| 5. | Four - point probe - test equipment used to test resistivity of wafers
四探针-测量半导体晶片表面电阻的设备。 |
| 6. | Generic specification of resistivity measuring instrument with four - point probe
直流四探针电阻率测试仪通用技术条件 |
| 7. | Standard test method for sheet resistance of thin metallic films with a collinear four - probe array
用共线四探针法对金属薄膜的薄膜耐力的试验方法 |
| 8. | Testing of semiconductor materials ; determination of the radial resistivity variation of silicon or germanium slices by means of the four - probe direct current method
半导体材料试验:采用四探针直流法测量硅片和锗片电 |
| 9. | Accomplishing the development of square four point probe instrument with the function of image manipulation for testing sheet resistance automatically
4完成具有图像识别功能的全自动四探针微区电阻率测试仪的研制。 |
| 10. | Testing of semiconductor materials ; measurement of the resistivity of silicon or germanium single crystals by means of the four probe direct current method with collinear array
半导体材料的试验.用探针直线排列的四探针直流法测 |
