| 1. | Design of amplifier circuit of photoelectric detection for weak signal
光电探测微信号放大器设计 |
| 2. | Photoelectric inspect signal processing
光电探测及信号处理 |
| 3. | A photodetetors used in the laser screens and its signal processing circuit
分离型激光启动靶光电探测系统及信号处理电路 |
| 4. | Moire principle and photo electricity detect technology are applied in designing the intelligent photoelectric measuring system
本系统采用莫尔条纹测长原理，结合光电探测技术对火炮身管?膛直径进行检测。 |
| 5. | Signal channel is composed of photodetection preamplifier and filter circuit , reference channel and correlation demodulator are realized by labview
信号通道由硬件实现,包括光电探测前置放大电路及滤波电路;参考通道及相关解调器部分则利用labview软件编程实现。 |
| 6. | In the system , a tunable dioxide laser is used as a sensor source , and the method of wavelength modulated is adopted , then concentration of gas is determined through detecting the generated second harmonic by opto - electronics converter
用可调谐二极管激光作为传感光源，采用波长调制方法，通过对谐波信号进行光电探测可得气体浓度。 |
| 7. | In the course of experiment , we design and set up a microlens test system , which includes several main parts , such as photoelectric detection , signal enlarging , data gathering and analyzing and image processing , etc
实验过程中，设计并搭建了一套完整的微透镜测试系统，包括光电探测、信号放大、数据采集和分析以及图像处理等几个主要部分。 |
| 8. | The different phenomena of ccd < wp = 7 > disturbed by different frequency pulse laser were observed . in experiment a ccd image tracking simulation system was disturbed effectively when tracking target region jammed by laser
采用脉冲激光实现了对处于相关跟踪方式下工作的光电探测跟踪模拟系统的干扰，指出只有对波门内实施有效的干扰才能使相关跟踪方式失效。 |
| 9. | This text introduces a rotation method for the absolute testing of three optic flats , which is based on the photoelectric detecting technique , laser interference technique and image manipulation technique , it can solve the deviation on n diameters of each optic flat and enhance the accuracy
本文介绍的基于光电探测技术、激光干涉技术、图像处理技术的带旋转三面互检法可以解出平面上n条直径线上的点的面形偏差，可以提高测量准确度。 |
| 10. | The sizing method based on fraunhofer diffraction is limited . because of the limitation of size parameter a ? 1 and size of photodetector , it ca n ' t measure the particles less than 5 microns accurately . to extending lower limit of measurement , inverse - fourier - transform technique is discussed
利用夫朗和费衍射理论时对粒子的界定要求尺寸参数a 1 ，又加上光电探测元件的尺寸受到限制，故不能准确地测量5微米以下的颗粒，为此必需扩大测量下限。 |
