scanning electron microscope(sem) meaning in Chinese
扫描电子显微镜
Examples
- Energy spectrometer and atomic absorption spectrum ( aas ) were used to determine their compositions , and scanning electron microscope ( sem ) , transmission electron microscopic ( tem ) were used to analysis the appearance of the samples
用原子吸收分光度法和能谱确定样品的组成。扫描电子显示镜( sem )和透射电子显微镜( tem )分析了样品的表面形貌及粒径特征。 - Ae signals released from different lay - ups composite specimens were acquired by a wideband transducer , and fracture surfaces of the specimens were observed by scanning electron microscope ( sem )
宽带传感器记录了不同角度纤维铺层的复合材料试样在拉伸破坏过程中的声发射信号，用扫描电子显微镜( sem )观察了试样的几种典型的损伤破坏断面，对比分析了不同类型的损伤机制。 - The results of x - ray photoelectron spectrum ( xps ) demonstrated the ce ions in pure phase ce : yig ( x < 0 . 2 ) were in the state of trivalence . scanning electron microscope ( sem ) analysis showed conglobation of yig and ce : yig particles , whose size were smaller than 1 urn
Xps的分析结果显示单相ce ： yig ( x 0 . 2时)中ce离子是以正三价的状态存在，这与物相分析结果是一致的。 - Various types of techniques have been applied to study the main principle problem . these techniques involve petrography , x - ray diffraction ( xrd ) , scanning electron microscope ( sem ) , carbon isotope , cathodoluminescence ( cl ) , fluid inclusion , and epoxy - resin casts
论文中所用的分析原理与技术方法包括：层序地层学分析、 x -衍射、扫描电镜、稳定同位素、阴极发光、流体包裹体与染色铸体薄片等。 - The influence factors on the pl intensities of the ps suspension , such as deposition time and applied electric field intensity , were examined in detail . the morphology of the deposited ps films and as - prepared ps has been measured using scanning electron microscope ( sem )
然后以zn zno仔s电极作正极，锌片作负极，置于纳米zno的悬浮体系中，在电场强度为300v cm时电泳20min ，这样形成了zno ps zno夹心结构。
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