electron micrograph meaning in English
电镜照片
电子微动描记器
电子微写器
电子显微镜检查，电子显微照片
电子显微镜相片
电子显微镜照片
电子显微镜照相
电子显微图
电子显微照相
Examples
- Xrd , transmission electron micrograph ( tem ) and polarized optical micrograph ( pom ) were used to measure the structure of nanocomposites , the nonisothermal crystallization kinetics of pp / pp - g - mah / org - mmt was studied by differential scanning calorimetry ( dsc ) , and their mechanical properties were tested
采用熔融插层法制备了聚丙烯接枝物蒙脱土纳米复合材料，通过xrd 、 tem 、 pom和dsc研究了纳米复合材料的结构及结晶动力学，并测试其力学性能。 - Finally build the foundation to prepare the composites of structure and m - type ferrite with structure and function properties . the constituent phases , microstructure and crystal dimension and crystal coalescence , mechanical properties , magnetic properties of the composites were investigated by means of x - ray diffraction ( xrd ) , scanning electron micrograp h ( sem ) and transmission electron micrograph ( tem ) , mechanical testing instrument , vibrating sample magnetometer ( vsm ) respectively
采用xrd技术鉴定复合材料的物相，利用sem ， tem来分析srfe12o19及其复合材料的结构形貌，颗粒大小及结合情况，使用伺服材料实验机、洛氏硬度计及振动样品磁强计( vsm )测试了复合陶瓷的抗弯强度、硬度及其磁性能，并探讨它们之间关系。 - Nanocrystalline cerium ( iv ) oxide ( ceo2 ) powders were prepared by means of different methods , sol - gel method , precipitation method and electrochemical method . the powders were analyzed by using x - ray diffraction ( xrd ) and transmission electron micrograph ( tem ) . ceo2 powders in different ways were compared from shape of particles and preparation technics
本文主要采用液相法中的溶胶-凝胶法、均匀沉淀法和电化学法制备了ceo _ 2纳米粉体，通过x -衍射、透射电子显微镜等手段对所制备的纳米粒子进行了表征，并从粒子的形态及制备工艺上进行了比较。 - By analyzing the microstructure of as - cast alloys with different surplus of samarium added , the optimum surplus of samarium is decided . by comparing the microstructure of the alloys annealed for different time , the ideal and economical annealing time is confirmed . the microstructure and phase composition of alloys during the whole preparation of sm2fe17nx are analyzed using the scanning electron micrograph with energy - dispersive x - ray analysis and x - ray diffraction patterns
本论文首先就熔炼工艺参数对铸态组织微结构的影响进行了探讨，并制定出一套较为合适的熔炼工艺；通过对不同钐加入量的铸态组织微观结构的观察分析，确定了原料配置过程中钐的最佳补偿量；通过对采用不同退火时间的合金组织进行比较，确定了理想、经济的退火时间；同时还利用扫描电子显微图像和x射线衍射图谱，比较了整个制备过程中，试样微结构和相组成的变化情况。 - The chemical composition and microstructures of the insulating thin films prepared by different methods were analyzed by x - ray diffraction ( xrd ) and scanning electron micrograph ( sem ) ; other properties such as electric resistance , the breakdown field strength and dielectric properties were evaluated using high resistance meter , voltage resistance meter and precision impedance analyzer respectively
采用x射线衍射仪( xrd )对表面绝缘薄膜的物相组成进行了分析,扫描电子显微镜( sem )对表面绝缘薄膜的微观结构进行了研究,并用绝缘电阻测试仪、耐压测试仪和精密阻抗分析仪分别对绝缘膜进行绝缘电阻率、击穿场强和介电性能的测试。