Chinese translation for "tem micrograph"

透射电子显微镜显微照片

Related Translations:

micrograph:  n.微写器；【物理学】微动扩大测定器；显微(镜)制图[照相、照片]。

tem:  登电磁测深控制系统的提起诉讼的限期灭火目标接战信文三亚安三嗪三亚胺嗪,三乙撑亚胺均三嗪,三乙撑蜜胺三乙撑三聚氰酰胺三乙烯亚胺三嗪, 替姆, 癌宁瞬变电磁法泰米泰姆透过电子显微镜透射电镜透射电子显微镜透射电子显微术英语四八级考试英语四级八级英语专业等级考试

emission micrograph:  发射式电子显微镜照片

electro micrograph:  电子显微镜相片

scanning micrograph:  扫描显微图象扫描显微照片

electron micrograph:  电镜照片电子微动描记器电子微写器电子显微镜检查，电子显微照片电子显微镜相片电子显微镜照片电子显微镜照相电子显微图电子显微照相

electronic micrograph:  电子微为器电子显微相片

sem micrograph:  扫描电子显微镜照相术

micrograph test:  微观组织试验

conventional tem:  普通透射电子显微镜

Example Sentences:

	1.	2 structure measurement of multi - wall carbon nanotubes after ball milling . the long cnts has been shorted by commen ball milling and effect of time on cnts has researched . the mechanism of cut has been analyzed . 3 the research of adsorption of mnoa by cnts , the tem micrograph of cnts and mechanism were analyzed 2多壁碳纳米管球磨后的结构表征，采用低速球磨机，使碳纳米管变短，澎器掀蕊研究了球磨时间对碳纳米管的影响，对其断裂机制作了定性分析。
	2.	For xrd , ellipsometry examinations , single - side - polished si ( lll ) wafers were used as substrates and for resistance measurement , glass was used and for infrared examination , double - side - polished si ( lll ) wafers were used and for ultraviolet - visible spectrophotometry , double - side - polished quartz wafers were used and for tem micrograph and electron diffraction pattern observation , cu nets deposited by formvar film were used . the cu - mgf2 cermet films were from 50 to 600nm thick 用于xrd分析、椭偏测量的单抛si ( 111 )晶片和电阻测试的载玻片上淀积膜厚约为600nm ；用于ir测试的双抛si ( 111 )晶片和uv测试的石英玻璃片上淀积膜厚约为250nm ；用于透射电镜分析的样品则淀积在400目铜网上的支撑formvar膜上，膜厚约为50 100nm 。

Similar Words：

"tem" Chinese translation, "tem band 8" Chinese translation, "tem cell" Chinese translation, "tem iconauthor" Chinese translation, "tem jian" Chinese translation, "tem mode" Chinese translation, "tem ocillin" Chinese translation, "tem sounding" Chinese translation, "tem study" Chinese translation, "tem technology-enabled marketing" Chinese translation