Standard guide for determining sims relative sensitivity factors from ion implanted external standards 根据离子移植外标物测定sims有关敏感因素的标准指南
2.
Surface chemical analysis - secondary - ion mass spectrometry - determination of relative sensitivity factors from ion - implanted reference materials 表面化学分析.次级离子质谱法.测定离子注入标样的相对灵敏系数
3.
Surface chemical analysis - auger electron spectroscopy and x - ray photoelectron spectroscopy - guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials 表面化学分析.俄歇电子光谱法和x射线光电子光谱法.同质材料定量分析用实验室测定相对敏感性系数的使用指南