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Home > english-chinese > "nonlinear dielectric" in Chinese

Chinese translation for "nonlinear dielectric"

非线性电介质
非线性介质


Related Translations:
dielectric capacity:  电容率介电容量
nonlinear optics:  非线性光学
nonlinear birefringence:  非线性双折射
nonlinear correlation:  非线性相关
nonlinear functions:  非线性函数
nonlinear dependence:  非线性关非线性相关
nonlinear solver:  非线性求解器
nonlinear corrections:  非线性改正
nonlinear generator:  非线性发生器
nonlinear material:  非线性材料
Example Sentences:
1.Nonlinear dielectric properties of pt p0 - 3 ferroelectric composite materials
复合物的非线性介电性质
2.Performance simulation of nonlinear dielectric under ac condition
非线性电介质交流激励下响应特性仿真
3.The natures of the probe and formation mechanisms in these techniques are different ; therefore , the images of spm can reflect different properties of sample surface . in this work , related properties of ferroelectric thin film were investigated as followed : the main factors determining the image formation of piezoresponse force microscopy ( pfm ) and scanning nonlinear dielectric microscopy ( sndm ) were studied . to avoid the misreading of the same conductive tip with different state , a new method of polarization distribution mapping with nonconductive tip was proposed , and the result of experiment demonstrated that the polarization distribution of ferroelectric thin films could be characterized well by the new approach
本工作主要分为以下几个部分:从研究铁电薄膜的压电响应力显微镜( pfm )和扫描非线性介电显微镜( sndm )成像的影响因素入手,讨论了针尖对成像质量的影响;为降低实验成本、减小导电探针针尖状态变化对铁电薄膜微区电性能测试的负面影响,提出了以非导电探针检测微区极性分布的方法,并在现有spa - 300hv型spm的实验平台上以pfm模式成功实现了新方法对铁电薄膜极性分布的表征。
4.Different principles and modes of sfm are discussed . the imaging principle of piezoresponse atomic force microscopy , scanning nonlinear dielectric microscopy , kelvin force microscopy are theoretically analysed , and the influence of voltage , contact force and microcantilever on the domain investigation is studied . the parameters of instrument are optimized using the same sample
探讨sfm检测电畴的不同机理和成像模式,从理论上分析了压电响应原子力显微镜( pfm ) 、扫描非线性介电显微镜( sndm )和开尔文力显微镜( kfm )检测电畴的成像原理;实验研究了电压、作用力、探针等的改变对电畴成像的影响。
Similar Words:
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