| 1. | These defects can be overcome by a film structure of pl / cr / cu / cr
这些缺陷可以通过在pi和cu之间采用cr膜作为阻挡层来解决。 |
| 2. | The x - ray diffraction data indicate that the cnx film structures are amorphous
在不锈钢片上的cnx薄膜，虽然没有剥落现象。 |
| 3. | Provides the theoretical reference for the anti - condensation design for buildings with double etfe film structure
为双层薄膜围护结构系统的防结露设计提供了理论参考。 |
| 4. | Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - generic specification
半导体器件.集成电路.混合集成电路和薄膜结构.生产线认证.总规范 |
| 5. | Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - blank detail specification
半导体器件.集成电路.混合集成电路和薄膜结构.生产线认证.空白详细规范 |
| 6. | Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - procedure for qualification approval
半导体器件.集成电路.第23 - 5部分:混合集成电路和薄膜结构.生产线认证.合格鉴定规程 |
| 7. | Semiconductor devices - integrated circuits - part 23 - 5 : hybrid integrated circuits and film structures ; manufacturing line certification ; procedure for qualification approval
半导体器件.集成电路.第23 - 5部分:混合集成电路和薄膜结构.生产线认证.鉴定批准 |
| 8. | Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - manufacturers ' self - audit checklist and report
半导体器件.集成电路.混合集成电路和薄膜结构.生产线认证.生产商自审清单和报告 |
| 9. | Semiconductor devices - integrated circuits - hybrid integrated circuits and film structures - manufacturing line certification - internal visual inspection and special tests
半导体器件.集成电路.混合集成电路和薄膜结构.生产线认证.内部目视检查和特殊试验 |
| 10. | Semiconductor devices - integrated circuits - part 23 - 2 : hybrid integrated circuits and film structures ; manufacturing line certification ; internal visual inspection and special tests
半导体器件.集成电路.第23 - 2部分:混合集成电路和薄膜结构.生产线认证.内部审查和特殊试验 |
