面积影响 meaning in Chinese

area effect

Internal scan is advanced for the difficulty of fixing the state of sequential circuit , can be divided into full - scan and partial - scan . in this paper we use full - scan according to the real circumstance of estarl and get high fault coverage with very little impact on the circuit
本文根据estar1的实际情况，设计实现了全扫描结构，既得到了较高的故障覆盖率，又对电路的延迟和芯片面积影响很小(延迟时间增加0 . 3 ，芯片面积增加0 . 01 ) 。