集成电路测试 meaning in Chinese
integrated circuit test
Examples
- Structure of system software of gh3183 integrated circuit tester
3183集成电路测试仪系统软件的结构 - Methods of expanding the element storehouse of integrated circuit test system
集成电路测试系统的元件库的扩充方法 - The use of edgeless nmos transistors in place of 2 - edgeless transistors eliminates the excessive radiation - induced edge leakage in many cmos parts after irradiation
为了测试最新设计的1万门cmos门阵列的抗辐射水平，本文设计了一个cmos集成电路测试样片。 - The general approach for ic test and verification and functional verification technology for processor is first discussed in this paper . then the efforts of author in this simulation - based verification task are expatiated particularly
本文首先探讨集成电路测试验证的一般方法和处理器的功能验证方法;然后详细阐述笔者在用基于模拟的功能验证对thuasdsp2004处理器进行验证时所做的工作。 - The original test methods mostly used the functional test vectors to test the integrated circuits . in the current , the design for testability ( dft ) techniques have been one of the necessary methods to design the more and more complex very large scale integrated circuits with the deep sub - micro meter technology
早期的集成电路测试主要通过功能测试向量来完成，但随着系统复杂度的不断提高和工艺技术的日益发展，可测性设计已经成为了集成电路设计所必不可少的辅助设计手段。