重离子辐照 meaning in Chinese
heavy ion irradiation
Examples
- Space used microelectronic devices irradiated by the ions , the curves of seu cross section of the devices versus let ( linear energy transition ) were measured
在重离子辐照下，测量器件单粒子翻转截面( )对重离子线传能密度( let )关系曲线，即- let曲线。 - When the charge deposited in the sv exceed critical charge qc , seu occurs . in order to decrease intensity of beams , heavy ions generated by tandem accelerator , bombards an au foil
我们用hi - 13串列加速器提供的重离子辐照航天微电子器件，为了降低离子束的强度，用重离子从au靶上的二次散射离子作为辐照源。 - It would take several hundred days to reach such a high dose by using currently available proton and neutron sources , while only several hours to several ten hours by the energetic heavy ion irradiation
由于辐照剂量高，若用现有的质子或中子源进行辐照需要几百天时间。采用重离子辐照模拟，仅需几个小时至几十个小时即可达到所需的辐照剂量，大大缩短分析测试周期。 - The experimental results show that the produced radiation damage and its thermal annealing behavior are the same for both irradiations in a - al2o3 , and that the heavy ion irradiation can well simulate the neutron and / or proton irradiation
实验表明，两种情况下辐照后的- al _ 2o _ 3材料中产生的辐照损伤及其退火效应一致，说明采用重离子辐照可以很好地模拟中子或质子辐照。 - In order to verify the reliability and validity of the heavy ion irradiation simulation of neutron and proton irradiations , radiation damage and its thermal annealing behavior in a - al2o3 irradiated at the equivalent dose by 85 mev 19f ions and by en > 1 mev neutrons , respectively , are studied
为验证重离子模拟辐照的可行性，首先进行了等效剂量下的中子辐照与重离子辐照后- al _ 2o _ 3样品中辐照损伤及其退火效应研究。