结温 meaning in Chinese
junction temperature
Examples
- Bipolar transistors of the type of 3dd820 and 3dd15d ( with f2 metal - pack ) are taken as an example in the study to verify the method of controllable junction temperature
以3dd820 , 3dd15d （ f2金属封装）双极晶体管为实验对象，对结温可控的晶体管稳态工作寿命试验方法进行了验证。 - Theoretical analysis indicates , the two technology helps reduce the concentration of current , lower the peak junction - temperature , and effectively avoid the appearance of devices " breakdown caused by heat and current
理论分析表明：上述两种技术，有利于减小电流集中现象，降低器件峰值结温，避免热击穿和二次击穿的发生。 - To increase the accuracy of the test method , a steady - state operation life test method with additional measuring and strictly controlling transistor junction temperature , in the highest temperature range , is given
旨在提高晶体管稳态工作寿命试验方法的可信度，提出了一种在试验过程中实时测量并严格控制晶体管结温在最高允许结温附近的稳态工作寿命试验方法。 - Analyzing the various problems of current steady - state operation life test standard , it is pointed out that , not measuring and controlling , transistor junction temperature in current transistor steady - state operation life test can lead to fatal inaccuracy of the test results
摘要在分析了现行标准中晶体管稳态工作寿命试验方法存在问题的基础上，认为在现行的稳态工作寿命试验中没有对晶体管的结温实施测量和控制，是导致试验结果不准确的重要原因。 - Theoretical analysis and simulation results demonstrate that asymmetries in lower and upper sidebands and imd magnitude variation depending on envelope frequency and junction temperature can appear , these results are in accordance with measurement results , and show that electrical and thermal memory effects exist
理论分析和仿真结果表明功率放大器上下边带不平衡和互调失真幅度依赖于包络频率和结温，结果和测量的结果是一致的，说明存在电和热记忆效应。