示差折光检测器 meaning in Chinese
differential refraction detector
Examples
- Differential refraction detector
示差折光检测器 - Detector : the most commonly used detector is ultraviolet absorption detector ; other universal detectors are photodiode array detector ( dad ) , fluorescence detector , refractive index detector , evaporative light - scattering detector , electrochemical detector and mass spectrometry detector etc
检测器最常用的检测器为紫外吸收检测器，其他常见的检测器有二极管阵列检测器( dad ) 、荧光检测器、示差折光检测器、蒸发光散射检测器、电化学检测器和质谱检测器等。 - A linear relation can be found between response value of ultraviolet absorption detector , fluorescence detector , electrochemical detector and refractive index detector and quality of the object under test ; however , relation between response value of evaporative light - scattering detector and quality of the object under test is usually not a linear one , therefore , mathematical conversion of response value should be made before making calculation when necessary
紫外、荧光、电化学和示差折光检测器的响应值与待测物的质量呈线性关系，但蒸发光散射检测器响应值与待测物的质量通常并不呈线性关系，必要时需对响应值进行数学转换后进行计算。 - Ultraviolet absorption detector , photodiode array detector ( dad ) , fluorescence detector , and electrochemical detector are optional detectors , response value of which is relative to not only quality of the object under test , but also structure of the compound ; refractive index detector and evaporative light - scattering detector are universal detector , responding to structure of all compounds ; evaporative light - scattering detector is quality - type detector , whose responding value only relates to quality of the object under test for compounds with similiar structures ; photodiode array detector ( dad ) can , at the same time , record absorption spectra of the object under test in a prescribed wave scope , consequently , it can be used in spectrum control and inspection of purity of chromatographic peaks of the object under test
紫外、二极管阵列、荧光、电化学检测器为选择性检测器，其响应值不仅与待测物的质量有关，还与化合物的结构有关；示差折光检测器和蒸发光散射检测器为通用型检测器，对所有的化合物结构均有响应；蒸发光散射检测器属质量型检测器，对结构类似的化合物，其响应值几乎仅与待测物的质量有关；二极管阵列检测器可以同时记录待测物在规定波长范围内的吸收光谱，故可用于待测物的光谱管制和色谱峰纯度的检查。