磁场热处理 meaning in Chinese
magnetic heat treatment
Examples
- One is to improve the photoconductivity by annealing the mpc film under magnetic field ; the other is to form composite multi - layer film of zno / pbpc and sno / pbpc , to change the spectral response range of mpc films
一是通过磁场热处理提高酞菁薄膜的光电导性能；二是通过将p型酞菁与n型材料异质复合，改变光谱响应范围。 - The results of gmr testing indicate that the gmr effect is much little in the assputtered films , but they will be enhanced after vaccum annealling in magnetic fileld . and we also found that the thickness of the films and the
磁阻性能测试结果表明,沉积态薄膜的磁阻性能微弱甚至没有,经过真空磁场热处理后的薄膜磁阻性能明显得到提高,并且薄膜厚度与退火温度均对薄膜的巨磁阻性能有重要影响。 - After vaccum annealling in magnetic fileld , the films were studied by grazing incidence x - ray diffraction analysis and scan of x - ray diffraction . the results showed that fe atoms could be separated from cu matrix , which results in the increasing of the interface scattering , and enhance gmr effect
通过对真空磁场热处理前后的薄膜的gixa分析及xrd扫描发现,真空磁场热处理能够使沉积态薄膜中的fe原子从cu的晶格中定向析出,这使得热处理后薄膜内部的界面散射增多,能够有效的提高薄膜的巨磁阻值。 - The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ) . the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different . the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique . by using atomic force microscope ( afm ) measured surface roughness of thin films . the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ) . the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ) . in addition , the giant magnetoresistance ( gmr ) effects of different films were also measured . the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射线分析( gixa )技术对不同cu - fe薄膜的相结构进行了研究;利用xrd扫描及不同角度的2扫描对薄膜进行了结晶织构及残余应力分析;运用小角x射线散射( saxs )技术测量了薄膜的厚度;采用原子力显微镜( afm )观察了薄膜的表面形貌;运用能量损失谱( eds )及x射线荧光光谱( xrf )对薄膜进行了成分标定;使用振动样品磁强计测量了不同cu - fe过饱和固溶体薄膜的磁性能;最后利用自制的磁阻性能测试设备测量了真空磁场热处理前后不同薄膜的巨磁阻值。