电路成品率 meaning in Chinese

circuit yield

This thesis aims at discussing the model of manufacturing defects , the principles of soft and hard faults induced by manufacturing defects , the effects of soft fault on circuit reliability and yield and the relationship between yield loss and reliability decrease caused by manufacturing defects . the author ' s main contributions are as following : reliability and yield are two significant factors to semiconductor manufacture . based on the principles of the manufacturability engineering , the thesis discusses the effects of the manufacturing defect on the functional yield , parametric yield and the reliability for ics , and abstracts geometric models from actual chips
本文对集成电路制造缺陷模型、由制造缺陷导致的软、硬故障的作用机理、软故障对电路可靠性和成品率的影响以及由制造缺陷导致的电路成品率的损失和可靠性下降之间的关系进行了系统的研究，主要研究结果如下：可靠性和成品率是影响半导体生产的两个主要因素，本文首先从集成电路的可制造性工程理论出发，讨论了制造缺陷在影响集成电路功能成品率、参数成品率和可靠性方面的作用。