深度分布 meaning in Chinese
depth distribution
Examples
- Depth profiling analysis by d p coincidence technique a preliminary result
符合技术进行深度分布分析初探 - We analysis some samples such as new semi - conductor gaas , new photoelectric material gan et al . , and get these depth spectrums
应用以上技术测量了c / lif多层膜、 gan膜和labacuo超导膜等多种样品的成分及杂质的深度分布。 - The depth profiling of the elements from light to medium could be simultaneously obtained by the ae - e telescope detector with a depth resolution about 20 ~ 30 nm
用e ? e望远镜探测器同时地得到靶材料上从轻至中重各种元素的深度分布，其深度分辨达20 30nm 。 - Energy resolutions of 3 . 3 % for the ae detector and 1 . 5 % for er detector are obtained by the in - beam test with the elastic scattered 12c from 197au at the energy of 50 . 3 mev
它可单独作erd分析，也可配合q3d磁谱仪进行erd分析，获得高精度的元素深度分布谱，也可用于其它核物理实验中。 - The measured spectra were transformed to the concentration profiling of the recoil atoms by using the knowledge of the rutherford cross section and the stopping power of the projectile and the recoils in the materials
利用卢瑟福散射截面和离子在靶材料中的阻止本领，编制程序将能谱转换成元素的深度分布。从而实现高精度的深度分辨测量。