椭圆光度法 meaning in Chinese

ellipsometry

The composition , structure , and properties of the as prepared composite films have been characterized in detail by uv - vis , ftir , and x - ray photoelectron spectra , ellipsometry , scanning electron microscopy , atomic force microscopy , transmission electron microscopy , fluorescence spectroscopy , and standard four - probe technique
采用uv - vis光谱、 ftir光谱、 x -射线光电子能谱、椭圆光度法、扫描电子显微镜、原子力显微镜、透射电子显微镜、荧光光谱和标准四探针技术对所制备的纳米复合膜进行了组成、结构和性能表征。