桥接故障 meaning in Chinese
bridge fault
Examples
- Through the simulative experiments about iddq detecting bridge faults in cmos and bicmos circuits , the fault coverage of iddq can be estimated
并对cmos电路与bicmos电路的桥接故障作了iddq检测仿真实验,分析了iddq检测的故障覆盖率。 - Not only fault model , but also test arithmetic demand to be farther improved . the thesis , focusing on the 20 - port register file , makes a fault analysis , particularly in complex bridge fault and crosstalk coupling fault aroused by word - line and bit - line of 20 - port
本文针对所设计的寄存器文件进行了故障分析,特别对20端口字线、位线引起的复杂桥接故障和串扰导致的耦合故障进行了详尽论述。 - The feasibility and effectiveness of the iddt testing are both validated by experiments . at last , transistor bridging faults are simulated based on iddq testing and gate bridging faults and stuck - at faults based on voltage testing through detaching a pattern pair into two independent patterns
最后，把一个输入向量对看成两个独立的向量，分别采用稳态电流测试方法和电压测试方法模拟桥接故障的晶体管级故障和桥接故障的门级故障及固定故障。 - Benefit from designer experience , expert system regulations are built by c language . through the inference , all fixed logic fault and most multi - line short circuit fault are detected by expert system . on that account , the design process built by c language will be a mode that can be imitated by other intelligent fault diagnosis system
对于专家系统智能故障诊断技术而言，构建专四川大学硕士学位论文家系统规则库和设计推理机制是重点，本文采用c语言构建规则库，然后通过精心设计的专家推理机，从而使得固定逻辑故障和大多数多线桥接故障能够被专家诊断系统检测出来。 - For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing
为了便于测试,我们将生产过程中集成电路出现的多种多样的缺陷抽象为各种模型。目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。电压测试主要针对固定型故障模型,多年的研究也取得了令人满意的结果; cmos电路中的桥接故障则宜用稳态电流测试方法( iddq )测试;对于电压和稳态电流难以测试的开路故障,可以使用瞬态电流测试( iddt )的方法进行测试。