扫描电镜照片 meaning in Chinese
scanning electron photomicrograph
stereoscan photograph
Examples
- On the sem photograph of the coating , we can see the distribution of the ptfe and sic particles clearly
在镀层的扫描电镜照片中，我们可以清晰的看到其中分布的ptfe 、 sic粒子。 - Finally , the size of ba - ferrite fine magnetic particles was measured and analyzed from sem image which was treated using a better technology , and the functions of the particle thickness , diameter and their ratio were obtained
对较佳工艺条件下得到的扫描电镜照片进行测量和分析，得到颗粒的厚度、直径和厚径比的函数分布。 - The tio2 / sio2 particle was characterized with scanning electron microscope ( sem ) , infrared spectroscopy and xps . it could be saw from the photo of sem that the compounding particle was still spherical , and there were some tio2 on the surface of sio2 particle . ti - o - si was formed between tio2 and sio2 , and this was confirmed by ft - ir analysis
并运用扫描电镜、红外光谱和xps等检测手段对其进行了表征和测试，从复合粒子的扫描电镜照片中可以看出，复合粒子仍为球形，表面包覆一层tio _ 2 ，与载体氧化硅粒子相比，粒径变化不大；其红外光谱表明， tio _ 2与载体sio _ 2粒子表面有ti ? o ? si键生成，这表明tio _ 2与sio _ 2粒子表面有较强的结合力。 - The scanning electron micrographs and the data of pore structure of gypsum and gypsum with the retarders also make us known the influence of retarders on the crystal morphology and pore structure , from which transformation of microstructure induced by retarders and the reason of which makes the strength drop a re analyzed . combined with the xps spectrum , the mechanism of action with the retarders are finally proposed
继而通过对孔结构和石膏硬化体晶体扫描电镜照片的观测，获得缓凝剂对石膏硬化体晶体形貌的影响和对孔结构的改变的信息，分析缓凝剂的带来石膏的微结构的变化，以及掺加缓凝剂带来石膏强度下降的原因所在。