导电探针 meaning in Chinese

conducting probe

The natures of the probe and formation mechanisms in these techniques are different ; therefore , the images of spm can reflect different properties of sample surface . in this work , related properties of ferroelectric thin film were investigated as followed : the main factors determining the image formation of piezoresponse force microscopy ( pfm ) and scanning nonlinear dielectric microscopy ( sndm ) were studied . to avoid the misreading of the same conductive tip with different state , a new method of polarization distribution mapping with nonconductive tip was proposed , and the result of experiment demonstrated that the polarization distribution of ferroelectric thin films could be characterized well by the new approach
本工作主要分为以下几个部分:从研究铁电薄膜的压电响应力显微镜( pfm )和扫描非线性介电显微镜( sndm )成像的影响因素入手,讨论了针尖对成像质量的影响;为降低实验成本、减小导电探针针尖状态变化对铁电薄膜微区电性能测试的负面影响,提出了以非导电探针检测微区极性分布的方法,并在现有spa - 300hv型spm的实验平台上以pfm模式成功实现了新方法对铁电薄膜极性分布的表征。