器件寿命 meaning in Chinese
device lifetime
Examples
- Altrec automatic life testing and recording of electronic components
自动化电子器件寿命测试与记录 - How to further improve the luminous efficiency , brightness , life length and operating voltage of organic light - emitting diodes ( oleds ) is still in research
如何进一步提高有机发光二极管( oled )的发光效率、提高发光亮度、延长器件寿命、降低工作电压还处于不断研究中。 - The electron radiation experiment for mosfet ' s is done with general linear accelerator and the simple method to predict the device lifetime by the electron radiation experiment is given
此外，还利用普通；挣山加速器进行了mosfet的电子辐射实验，并提出了运用电子辐射实验预测器件寿命的方法。 - Experimental results indicated that for the two reverse - bias stresses the degradation of the devices depended on magnitude and energy of the injected carriers . fc stress condition may speed up the degradation of devices and shorten the time of evaluating the devices life
在实验中我们发现对这两种应力，器件的退化与注入的热载流子的数量以及能量有关， fc应力方法可以加速器件的退化，缩短评估器件寿命的时间。 - Low permeation ratio measurement through oled is very critical and there is no effective method to measuring the low permeation moisture rate of 1 10 - 6 g / m 2 / day , hence , the development of a moisture permeation measurement system would be very useful to help us understanding of permeation mechanisms and the device lifetime as well as degradation
水汽通过oled封装的渗透率的大小对于oled的器件寿命的研究非常重要,它的值一般要求达到1 10 - 6g / m2 / day ,但目前还没有有效的测量方法测量如此小的值。因此,对水汽渗透率的测量系统的研究将对我们研究渗透的机理、器件封装,器件寿命等方面提供很大的帮助。