可测性设计 meaning in Chinese
design for testability，dft
Examples
- Design of high - frequency local source of very small aperture terminal
高频锁相环的可测性设计 - Application and analysis of the scan path in asic ' s testable design
可测性设计中扫描路径的应用与分析 - Dft for high - frequency pll
高频锁相环的可测性设计 - Application of boundary scan technique to the design for board - level test
边界扫描技术在板级可测性设计中的应用 - Design for testability means adjusting the structure of circuit and making the circuit easy to test
可测性设计即调整电路的内部结构，使电路变得易测。