collector-base meaning in Chinese

集电极-基极

In this thesis two reverse - bias electrical stress methods were used to investigate the reliability of the devices . one is a typical of oc stress method with collector open and reverse - bias emitter - base junction . another one , a new technique , is fc stress method with forward - bias collector - base junction and reverse - bias emitter - base junction
本论文采用两种反偏电应力方法考察器件的可靠性，一种为传统的oc应力（集电极开路，发射结反向偏置）方法，另一种为新的方法fc应力（集电结正向偏置，发射结反向偏置）方法。