晶圆测试 meaning in English
wafer probing
Examples
- Wafer test probe test
晶圆测试探针测试 - If we can eliminate the bad chips in advance of the testing stage , then the non - meaningful waste can also be decreased in the later process
若能及早将不良的芯片在晶圆测试阶段即予以剔除，便能减少后段加工工序中不必要的浪费。